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ZTE Communications ›› 2024, Vol. 22 ›› Issue (2): 94-98.DOI: 10.12142/ZTECOM.202402012

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  • 收稿日期:2024-03-23 出版日期:2024-06-25 发布日期:2024-06-25

Waveguide Bragg Grating for Fault Localization in PON

HU Jin1, LIU Xu1, ZHU Songlin2(), ZHUANG Yudi1, WU Yuejun1, XIA Xiang3, HE Zuyuan1   

  1. 1.School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
    2.Wireline Product Planning Department, ZTE Corporation, Shanghai 201203, China
    3.Hangzhou Electric Connector Factory, Hangzhou 310052, China
  • Received:2024-03-23 Online:2024-06-25 Published:2024-06-25
  • About author:HU Jin received his BS degree in electronic information science and technology from Nanjing University, China in 2020, and MS degree in electronic communication engineering from Shanghai Jiao Tong University, China in 2024, focusing on the research of novel planar lightwave circuit-based devices for next generation optical communications system.
    LIU Xu received his BS degree in Internet of Things engineering from University of Electronic Science and Technology of China in 2020. He is currently working toward his PhD degree at Shanghai Jiao Tong University, China. His research interests include optical interconnects and polymer optical waveguide devices.
    ZHU Songlin (zhu.songlin@zte.com.cn) received his MS degree in theoretical physics from Hangzhou University, China in 1998 and PhD degree in electronic science and technology from Zhejiang University, China in 2001. He joined the Wireline Product Planning Department, ZTE Corporation in 2001. His research interests include FTTx technology for optical communications and OTDR technology for optical sensing applications.
    ZHUANG Yudi received her MS degree in electrical engineering from Illinois Institute of Technology, USA in 2014. She is currently an engineer of the Department of Electronic Engineering, Shanghai Jiao Tong University, China. Her research interests include specialty optical fibers and waveguides for optical communications and sensing application.
    WU Yuejun received his MS degree in measurement technology and instruments from Shanghai University, China in 2002. In the subsequent years, he joined Philips (China) Semiconductor, Atmel (Shanghai) Semiconductor and Intel (Asia) R&D center, where he worked as a senior staff engineer/application manager until 2020. Currently he is the Laboratory Director of School of Sensing Science and Engineering, Shanghai Jiao Tong University, China. His research interests include information detection and control, intelligent instruments and sensing application.
    XIA Xiang received his PhD degree in optical engineering from Zhejiang University, China in 2016. He joined Hangzhou Electric Connector Factory in 2017, primarily responsible for the research and development of optical coating and planar lightwave circuit products. He has a wealth of experience in the end-to-end process of passive optical chips, encompassing design, development, fabrication, and packaging. His main research interests include planar lightwave circuits and thin film filter for optical communication systems.
    HE Zuyuan received his BS and MS degrees in electronic engineering from Shanghai Jiao Tong University, China in 1984 and 1987, respectively, and PhD degree in photonics from the University of Tokyo, Japan in 1999. He joined CIENA Corporation, Linthicum, USA in 2001, as a lead engineer heading the optical testing and optical process development group. He returned to the University of Tokyo as a lecturer in 2003, and then became an associate professor in 2005 and a full professor in 2010. He is now a Chair Professor and the head of Department of Electronic Engineering, Shanghai Jiao Tong University. His current research interests include optical fiber sensors, specialty optical fibers, and optical interconnects.
  • Supported by:
    the ZTE Industry-University-Institute Fund Project(IA20221202011)

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Abstract:

Femtosecond laser direct inscription is a technique especially useful for prototyping purposes due to its distinctive advantages such as high fabrication accuracy, true 3D processing flexibility, and no need for mold or photomask. In this paper, we demonstrate the design and fabrication of a planar lightwave circuit (PLC) power splitter encoded with waveguide Bragg gratings (WBG) using a femtosecond laser inscription technique for passive optical network (PON) fault localization application. Both the reflected wavelengths and intervals of WBGs can be conveniently tuned. In the experiment, we succeeded in directly inscribing WBGs in 1×4 PLC splitter chips with a wavelength interval of about 4 nm and an adjustable reflectivity of up to 70% in the C-band. The proposed method is suitable for the prototyping of a PLC splitter encoded with WBG for PON fault localization applications.

Key words: planar light circuit, power splitter, waveguide Bragg gratings, femtosecond laser, optical network fault localization